TEM, HRTEM, aberration-corrected HAADF-STEM and EDS mapping
Ni SAs@UiO-66-NH2(Hf) powder · Powder
Microscopy and elemental mapping of Ni, C, O, N and Hf in Ni SAs@UiO-66-NH2.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HRTEM lattice spacing indexed to UiO-66-NH2 (100) | 1.24 nm | — | — | Text Exact Reported | 4 · Structure and Morphology · Figure 1e |
| HRTEM lattice spacing indexed to UiO-66-NH2 (110) | 1.08 nm | — | — | Text Exact Reported | 4 · Structure and Morphology · Figure 1e |