Diffraction Structure — Solvothermal preparation of an electrocatalytic metalloporphyrin MOF thin film and its redox hopping charge-transfer mechanism

Measurement evidence

Diffraction Structure

Solvothermal preparation of an electrocatalytic metalloporphyrin MOF thin film and its redox hopping charge-transfer mechanism · Ahrenholtz S.R., Epley C.C., Morris A.J. · Journal of the American Chemical Society · 2014 · 2464-2472

1 measurement group · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

grazing-incidence powder X-ray diffraction (PXRD)

CoPIZA/FTO thin film electrode · Electrode

Rigaku Altima IV; Cu Kalpha radiation, grazing incidence thin-film stage, 2theta range 5-50 deg, 0.05 deg steps, 0.5 deg/min.

Geometry
thin film on FTO
Context
target CoPIZA/FTO compared with simulated CoPIZA pattern and FTO substrate peaks
Measurement source
7 · Experimental Section - Powder X-ray Diffraction (PXRD) · Figure 2C; Figure S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CoPIZA/FTO additional PXRD peaks absent from single-crystal pattern6.4 and 7.2 deg 2thetaText
Rounded Reported
2 · Results and Discussion · Figure 2C
CoPIZA/FTO PXRD matched peak10.1 deg 2thetaText
Rounded Reported
2 · Results and Discussion · Figure 2C
CoPIZA/FTO PXRD matched peak6.1 deg 2thetaText
Rounded Reported
2 · Results and Discussion · Figure 2C
CoPIZA/FTO PXRD matched peak6.9 deg 2thetaText
Rounded Reported
2 · Results and Discussion · Figure 2C
CoPIZA/FTO PXRD matched peak7.6 deg 2thetaText
Rounded Reported
2 · Results and Discussion · Figure 2C
CoPIZA/FTO PXRD matched peak9.7 deg 2thetaText
Rounded Reported
2 · Results and Discussion · Figure 2C