SEM and AFM
CoPIZA/FTO thin film electrode · Electrode
SEM on LEO/Zeiss 1550 field-emission microscope at 5.0 kV; AFM on Veeco MultiMode in tapping mode.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| CoPIZA/FTO maximum reported film/network thickness | 500 nm | — | — | Text Range | 3 · Results and Discussion · Figure S2 |
| CoPIZA/FTO minimum reported film/network thickness | 80 nm | — | — | Text Range | 3 · Results and Discussion · Figure S2 |