dark J-V
PSC with Li-TFSI@NH2-MIL-101 doped HTL · Electrode
dark-condition device leakage comparison
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| dark leakage current comparison | lower leakage current for Li-TFSI@NH2-MIL-101 doped device | — | — | Qualitative Qualitative | 6 · 2.3. Device performance · Fig. 5f |