cMOF Evidence Base
Diffraction Structure — Morphologies of thienyl based bimetallic metal-organic frameworks controlled by solvents for high specific capacitance supercapacitor

Measurement evidence

Diffraction Structure

Morphologies of thienyl based bimetallic metal-organic frameworks controlled by solvents for high specific capacitance supercapacitor · Song S., Ma X., Zhang B. et al. · Journal of Energy Storage · 2022 · 103627

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (D8 DISCOVER A25)

X-ray diffraction and scattering

E-NCT MOF · Nanosheet

XRD patterns compared for E/M/D-NCT MOF; PTA-NC XRD is shown in SI Figure S1.

Context
pristine powder solvent variants
Measurement source
4 · 3.1. Structural and morphology characterization · Figure 1b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Co-MOF characteristic XRD peaks in M/E-NCT10.76, 19.5 and 26.22 degrees 2theta——Text
Exact Reported		4 · 3.1. Structural and morphology characterization · Figure 1b
Ni-MOF characteristic XRD peaks in M/E-NCT5.52, 19.6 and 25.72 degrees 2theta——Text
Exact Reported		4 · 3.1. Structural and morphology characterization · Figure 1b