SI XRD, FT-IR, SEM and TEM rendered-page review
Infrared spectroscopyX-ray diffraction and scatteringScanning electron microscopyTransmission electron microscopy
PTA-NC MOF · Powder
PTA-NC MOF comparison sample characterised by XRD (Fig. S1), FT-IR (Fig. S2), SEM (Fig. S3) and TEM (Fig. S4).
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PTA-NC MOF SEM morphology | aggregated rough particles/spheroids; scale bars 10 um and 500 nm | — | — | Visual Estimate Qualitative | 2 · Supporting information · Figure S3 |
| PTA-NC MOF TEM morphology | dark spherical/aggregated particles with a 500 nm high-magnification scale bar | — | — | Visual Estimate Qualitative | 3 · Supporting information · Figure S4 |
| PTA-NC MOF dominant XRD low-angle peak | dominant peak near 8-9 degrees 2theta in SI Fig. S1 | — | approximately | Figure Axis Approximate | 1 · Supporting information · Figure S1 |