TEM and electron diffraction
Complex 4 powder / pressed pellet · Powder
TEM on FEI Technai G2 F20 at 200 kV using copper grid for sample loading; representative complexes 2, 3 and 4.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Average particle size, complex 2 | average particle size approx 40 nm; some approx 20 nm and some approx 103 nm | — | — | Text Approximate | p008-p009 · 3.7 Transmission electron microscopy micrograph · Fig. 9 |
| Average particle size, complex 3 | particle size approx 30 nm | — | — | Text Approximate | p008-p009 · 3.7 Transmission electron microscopy micrograph · Fig. 9 |
| Average particle size, complex 4 | average particle size approx 50 nm | — | — | Text Approximate | p008-p009 · 3.7 Transmission electron microscopy micrograph · Fig. 9 |
| Electron diffraction crystallinity | regular pattern of spots in electron diffraction pattern of 2, 3 and 4 indicates microcrystalline nanoparticles | — | — | Text Qualitative | p008 · 3.7 Transmission electron microscopy micrograph · Fig. 9c |