XRD, FTIR, SEM, TEM/EDS, TGA, ICP, XPS, Raman, BET
PTCDA-LNMO powder · Powder
Characterisation instrument details reported for all Ni-Mn-MOF and LNMO samples.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| TGA heating rate | 10 | — | — | Text Exact Reported | 2 · 2.2 Materials characterization |
| TGA air flow | 10 | — | — | Text Exact Reported | 2 · 2.2 Materials characterization |
| Raman excitation wavelength | 633 | — | — | Text Exact Reported | 2 · 2.2 Materials characterization |
| XRD scan range low angle | 10 | — | — | Text Exact Reported | 2 · 2.2 Materials characterization |
| XRD scan range high angle | 80 | — | — | Text Exact Reported | 2 · 2.2 Materials characterization |
| XRD scan rate | 5 | — | — | Text Exact Reported | 2 · 2.2 Materials characterization |
| SI ligand structure panel | six ligand molecular structures shown | — | — | Qualitative Qualitative | 4 · Appendix A. Supporting Information · Fig. S5 |