scanning electron microscopy (SEM)
Zr(dcphOH-NDI)@FTO thin-film electrodes · Electrode
SEM morphology and cross-section thickness of Zr(dcphOH-NDI)@FTO; ImageJ used for surface area and film thickness.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| SEM morphology assignment | SEM confirms PIZOF morphology of MOF films | — | — | Caption Qualitative | 5 · Zr(dcphOH-NDI)@FTO Thin Film Characterization · Figure S1 |