Microscopy Morphology — Superexchange Charge Transport in Loaded Metal Organic Frameworks

2 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Pristine HKUST-1 SURMOF, 5 spray cycles · Thin Film

Height profile across chemically etched SURMOF edge; tapping mode, Multimode Bruker J scanner, 0.4 Hz, ambient laboratory conditions.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Pristine HKUST-1 SURMOF thickness, 10 cycles	69.4 +/- 8.5 nm	—	+/- 8.5 nm	Text Exact Reported	S5 · 2.1.1 Thickness evaluation · Figure S3
Pristine HKUST-1 SURMOF thickness, 5 cycles	44.7 +/- 3.9 nm	—	+/- 3.9 nm	Text Exact Reported	S5 · 2.1.1 Thickness evaluation · Figure S3
Pristine HKUST-1 SURMOF thickness, 7 cycles	57.1 +/- 5.6 nm	—	+/- 5.6 nm	Text Exact Reported	S5 · 2.1.1 Thickness evaluation · Figure S3

TCNQ-loaded HKUST-1 SURMOF, 5 spray cycles · Thin Film

Height profile across chemically etched SURMOF edge for TCNQ-loaded thickness series.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
F4-TCNQ-loaded HKUST-1 SURMOF thickness evaluation	no thickness evaluation performed; assigned by spray-cycle count	—	—	Text Qualitative	S10 · 2.3.1 Thickness evaluation
TCNQ-loaded HKUST-1 SURMOF thickness, 10 cycles	62.3 +/- 7.3 nm	—	+/- 7.3 nm	Text Exact Reported	S5 · 2.1.1 Thickness evaluation · Figure S3
TCNQ-loaded HKUST-1 SURMOF thickness, 5 cycles	33.3 +/- 3.0 nm	—	+/- 3.0 nm	Text Exact Reported	S5 · 2.1.1 Thickness evaluation · Figure S3
TCNQ-loaded HKUST-1 SURMOF thickness, 7 cycles	53.2 +/- 4.1 nm	—	+/- 4.1 nm	Text Exact Reported	S5 · 2.1.1 Thickness evaluation · Figure S3