Powder X-ray diffraction (PXRD) with simulated PXRD comparison
Ni3(Ni3.HAHATN)2 nanosheets · Nanosheet
Experimental and simulated PXRD patterns assigned to few-layer Ni3(Ni3.HAHATN)2.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Interlayer separation | about 3.43 A | — | about | Text Approximate | main p.2-3, article p.2000012-2 to 3 · Results and Discussion · Figure 1 |
| PXRD (001) peak position | 25.94 deg corresponding to (001) plane | — | — | Text Exact Reported | main p.3, article p.2000012-3 · Results and Discussion · Figure 1 |
| PXRD (100) peak position | 3.34 deg assigned to (100) | — | — | Text Exact Reported | main p.3, article p.2000012-3 · Results and Discussion · Figure 1 |
| PXRD (200) peak position | 5.98 deg assigned to (200) | — | — | Text Exact Reported | main p.3, article p.2000012-3 · Results and Discussion · Figure 1 |