cMOF Evidence Base
Microscopy Morphology — Synthesis of a novel double-ligand nickel conductive metal–organic framework material and its electrochemical characterization for supercapacitors

Measurement evidence

Microscopy Morphology

Synthesis of a novel double-ligand nickel conductive metal–organic framework material and its electrochemical characterization for supercapacitors · Wang H., Zhu C., Wu M. et al. · Journal of Materials Science · 2021 · 2517-2527

1 measurement group · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, TEM, HRTEM, EDX and elemental mapping

Scanning electron microscopyTransmission electron microscopyElemental microanalysis and mapping

Ni-MOF green powder · Powder

SEM/TEM morphology and EDX/mapping for element distribution.

Context
pristine Ni-MOF framework
Measurement source
3-6 · Materials characterization / Structure and morphology · Figure 3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
EDX/mapping elementsC, N, O and Ni uniformly distributed——Text
Qualitative		4,6 · Structure and morphology · Figure 3d-h
TEM morphologyhollow structure——Text
Qualitative		4,6 · Structure and morphology · Figure 3b
SEM morphologyuniform, porous structure——Text
Qualitative		4,6 · Structure and morphology · Figure 3a