Diffraction Structure — Hierarchical conductive metal-organic framework films enabling efficient interfacial mass transfer

Measurement evidence

Diffraction Structure

Hierarchical conductive metal-organic framework films enabling efficient interfacial mass transfer · Huang C., Shang X., Zhou X. et al. · Nature Communications · 2023 · 3850

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction / PXRD

X-ray diffraction and scattering

Zn-HHTP-H film on Si/SiO2 · Thin Film

Room-temperature PXRD using Cu-Kalpha radiation; time-dependent ZIF-8-to-Zn-HHTP transformation tracked.

Temperature: room temperature
Context: pristine c-MOF film
Measurement source: S11 · Supplementary Fig. 3 · Supplementary Fig. 3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ZIF-8 peaks vanish after 12 h conversion	For the sample at 12 h, the peaks ascribed to ZIF-8 vanished, leaving a single phase of Zn-HHTP.	—	—	Caption Exact Reported	S11 · Supplementary Fig. 3 text · Supplementary Fig. 3