cMOF Evidence Base
Microscopy Morphology — Hierarchical conductive metal-organic framework films enabling efficient interfacial mass transfer

Measurement evidence

Microscopy Morphology

Hierarchical conductive metal-organic framework films enabling efficient interfacial mass transfer · Huang C., Shang X., Zhou X. et al. · Nature Communications · 2023 · 3850

2 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

TEM, HRTEM, SEM

Scanning electron microscopyTransmission electron microscopy

PcCu-Zn-H film on Si/SiO2 · Thin Film

PcCu-Zn-H and Co-HHTP-H films scraped from films for TEM; SEM cross-sections.

Context
pristine c-MOF films
Measurement source
6-7 · Generality of the HSAID strategy · Fig. 6a,c; Supplementary Fig. 39
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Co-HHTP (100) lattice spacing1.8 nm——Text
Rounded Reported		6 · Generality · Supplementary Fig. 39
PcCu-Zn (100) lattice spacing1.7 nm——Text
Rounded Reported		6 · Generality · Supplementary Fig. 39

TEM, HRTEM, SAED, SEM

Scanning electron microscopyTransmission electron microscopy

Zn-HHTP-H film on Si/SiO2 · Thin Film

Zn-HHTP-H scraped from film; cross-sectional SEM and electron microscopy.

Context
pristine c-MOF film
Measurement source
2-4 · Synthesis and characterization · Figs. 2e, 3a-d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Zn-HHTP-H cavity sizeMarked as a best value within this paper~500 nm cavities——Text
Approximate		3 · Morphology control · Supplementary Fig. 13
Zn-HHTP-H hollow shell thicknessapproximately 20 nm——Text
Approximate		2 · Synthesis and characterization · Fig. 3a
Zn-HHTP-HS cavity size~175 nm——Text
Approximate		3 · Morphology control · Supplementary Figs. 16-17
Zn-HHTP (022) lattice spacing0.31 nm——Text
Rounded Reported		2 · Synthesis and characterization · Fig. 3c
Zn-HHTP (100) lattice spacing1.8 nm——Text
Rounded Reported		2 · Synthesis and characterization · Fig. 3c