Atomic force microscopy thickness profile
Ni-BAND thin film · Thin Film
AFM at film edge to determine spin-coated film thickness.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| spin-coated film thickness | 300 nm | — | — | Text Rounded Reported | 2 · Results · Supplementary Fig. 1 |