HAADF-STEM EDX elemental mapping and accumulative EDX spectrum
as-synthesised 2DCIF nanosheet powder · Nanosheet
Single-sheet EDX-STEM analysis of pristine nanosheets
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX-STEM C atomic percentage | C 57.6 ± 5.9 atomic % | — | ± 5.9 | SI Table Exact Reported | 8 · III.2 HAADF-STEM · Table S1 |
| EDX-STEM Cu atomic percentage | Cu 6.1 ± 1.1 atomic % | — | ± 1.1 | SI Table Exact Reported | 8 · III.2 HAADF-STEM · Table S1 |
| EDX-STEM N atomic percentage | N 25.6 ± 5.8 atomic % | — | ± 5.8 | SI Table Exact Reported | 8 · III.2 HAADF-STEM · Table S1 |
| EDX-STEM O atomic percentage | O 10.7 ± 2.4 atomic % | — | ± 2.4 | SI Table Exact Reported | 8 · III.2 HAADF-STEM · Table S1 |