X-ray diffraction (Cu K-alpha, lambda = 1.5418 A)
Ni2.1Cu0.9(HITP)2 film on carbon cloth · Electrode
XRD pattern of electrodeposited Ni2.1Cu0.9(HITP)2 film.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| (001) peak position | 27.3 degrees | — | — | Text Rounded Reported | 2 · 2.1 Material Design and Structural Characterization · Figure 1b |
| (100) peak position | 4.6 degrees | — | — | Text Rounded Reported | 2 · 2.1 Material Design and Structural Characterization · Figure 1b |
| XRD diffraction peak list | 4.6, 12.5, 13.5, 14.1, 16.3, 17.8, 25.5, and 27.3 degrees | — | — | Text Rounded Reported | 2 · 2.1 Material Design and Structural Characterization · Figure 1b |