Spectroscopy — Electrodeposition of Ni/Cu Bimetallic Conductive Metal–Organic Frameworks Electrocatalysts with Boosted Oxygen Reduction Activity for Zinc–Air Batteries

Measurement evidence

Spectroscopy

Electrodeposition of Ni/Cu Bimetallic Conductive Metal–Organic Frameworks Electrocatalysts with Boosted Oxygen Reduction Activity for Zinc–Air Batteries · Liu M., Zhao J., Dong H. et al. · Small · 2024 · 2405309

13 measurement groups · 57 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

FT-IR spectroscopy

Infrared spectroscopy

Ni2.1Cu0.9(HITP)2 film on carbon cloth · Electrode

FT-IR spectra of M3(HITP)2 samples.

Geometry: film/sample not further specified
Context: pristine conductive MOF films
Measurement source: 4 · 2.1 Material Design and Structural Characterization · Figure 2a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Benzene-ring FTIR peak	1677 cm-1	—	—	Text Rounded Reported	4 · 2.1 Material Design and Structural Characterization · Figure 2a
Benzene-ring FTIR peak	2971 cm-1	—	—	Text Rounded Reported	4 · 2.1 Material Design and Structural Characterization · Figure 2a
N-H bending peak	1042 cm-1	—	—	Text Rounded Reported	4 · 2.1 Material Design and Structural Characterization · Figure 2a
N-H stretch peak	3430 cm-1	—	—	Text Rounded Reported	4 · 2.1 Material Design and Structural Characterization · Figure 2a

Raman spectroscopy (532 nm Ar ion laser)

Raman spectroscopy

Ni2.1Cu0.9(HITP)2 film on carbon cloth · Electrode

Raman spectra of M3(HITP)2 samples; D/G bands and ID/IG ratios.

Geometry: film/sample not further specified
Context: pristine conductive MOF films
Measurement source: 4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Raman D band	1353 cm-1	—	—	Text Rounded Reported	4 · 2.1 Material Design and Structural Characterization · Figure 2b
Raman G band	1588 cm-1	—	—	Text Rounded Reported	4 · 2.1 Material Design and Structural Characterization · Figure 2b

Raman spectroscopy (532 nm Ar ion laser)

Raman spectroscopy

Cu3(HITP)2 film on carbon cloth · Electrode

Raman spectra of M3(HITP)2 samples; D/G bands and ID/IG ratios.

Geometry: film/sample not further specified
Context: pristine conductive MOF films
Measurement source: 4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ID/IG ratio for Cu3(HITP)2	about 1.28	—	—	Text Approximate	4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Raman spectroscopy (532 nm Ar ion laser)

Raman spectroscopy

Ni1.6Cu1.4(HITP)2 film on carbon cloth · Electrode

Raman spectra of M3(HITP)2 samples; D/G bands and ID/IG ratios.

Geometry: film/sample not further specified
Context: pristine conductive MOF films
Measurement source: 4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ID/IG ratio for Ni1.6Cu1.4(HITP)2	about 1.14	—	—	Text Approximate	4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Raman spectroscopy (532 nm Ar ion laser)

Raman spectroscopy

Ni2.1Cu0.9(HITP)2 film on carbon cloth · Electrode

Raman spectra of M3(HITP)2 samples; D/G bands and ID/IG ratios.

Geometry: film/sample not further specified
Context: pristine conductive MOF films
Measurement source: 4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ID/IG ratio for Ni2.1Cu0.9(HITP)2	about 1.12	—	—	Text Approximate	4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Raman spectroscopy (532 nm Ar ion laser)

Raman spectroscopy

Ni2.3Cu0.7(HITP)2 film on carbon cloth · Electrode

Raman spectra of M3(HITP)2 samples; D/G bands and ID/IG ratios.

Geometry: film/sample not further specified
Context: pristine conductive MOF films
Measurement source: 4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ID/IG ratio for Ni2.3Cu0.7(HITP)2	about 1.13	—	—	Text Approximate	4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Raman spectroscopy (532 nm Ar ion laser)

Raman spectroscopy

Ni3(HITP)2 film on carbon cloth · Electrode

Raman spectra of M3(HITP)2 samples; D/G bands and ID/IG ratios.

Geometry: film/sample not further specified
Context: pristine conductive MOF films
Measurement source: 4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ID/IG ratio for Ni3(HITP)2	about 1.03	—	—	Text Approximate	4-5 · 2.1 Material Design and Structural Characterization · Figure 2b

X-ray photoelectron spectroscopy (XPS)

X-ray photoelectron spectroscopy

Ni2.1Cu0.9(HITP)2 film on carbon cloth · Electrode

High-resolution Ni 2p, Cu 2p and N 1s spectra and composition analysis of M3(HITP)2 samples.

Geometry: film/sample not further specified
Context: pristine conductive MOF films
Measurement source: 4-5 · 2.1 Material Design and Structural Characterization · Figure 2c-f; Table S1 cited

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu+ binding energy peak	932.3 eV	—	—	Text Rounded Reported	5 · 2.1 Material Design and Structural Characterization · Figure 2d
Cu+ binding energy peak	953.5 eV	—	—	Text Rounded Reported	5 · 2.1 Material Design and Structural Characterization · Figure 2d
Cu2+ binding energy peak	934.9 eV	—	—	Text Rounded Reported	5 · 2.1 Material Design and Structural Characterization · Figure 2d
Cu2+ binding energy peak	954.8 eV	—	—	Text Rounded Reported	5 · 2.1 Material Design and Structural Characterization · Figure 2d
Relative M-Nx content trendMarked as a best value within this paper	Ni2.1Cu0.9(HITP)2 highest M-Nx content among M3(HITP)2 samples	—	—	Visual Estimate Qualitative	5 · 2.1 Material Design and Structural Characterization · Figure 2f
N 1s C-N peak	about 398.8 eV	—	—	Text Approximate	5 · 2.1 Material Design and Structural Characterization · Figure 2e
N 1s M-Nx peak	around 400.1 eV	—	—	Text Approximate	5 · 2.1 Material Design and Structural Characterization · Figure 2e
Ni 2p1/2 binding energy	873.7 eV	—	—	Text Rounded Reported	5 · 2.1 Material Design and Structural Characterization · Figure 2c
Ni 2p3/2 binding energy	856.2 eV	—	—	Text Rounded Reported	5 · 2.1 Material Design and Structural Characterization · Figure 2c
Ni satellite peak	861.7 eV	—	—	Text Rounded Reported	5 · 2.1 Material Design and Structural Characterization · Figure 2c
Ni satellite peak	880.2 eV	—	—	Text Rounded Reported	5 · 2.1 Material Design and Structural Characterization · Figure 2c

X-ray photoelectron spectroscopy elemental quantification

X-ray photoelectron spectroscopy

Cu3(HITP)2 film on carbon cloth · Electrode

XPS atomic percentages and Ni/Cu ratios reported in SI Table S1.

Context: pristine conductive MOF film deposited on carbon cloth
Measurement source: 27 · Supplementary Tables · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
XPS C atomic percentage Cu3(HITP)2	76.11	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Cu atomic percentage Cu3(HITP)2	4.13	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
Theoretical Ni/Cu feed ratio Cu3(HITP)2	0/1	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS N atomic percentage Cu3(HITP)2	3.38	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni atomic percentage Cu3(HITP)2	-	—	—	SI Table Qualitative	27 · Supplementary Tables · Table S1
XPS O atomic percentage Cu3(HITP)2	16.38	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni/Cu ratio Cu3(HITP)2	0/1	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1

X-ray photoelectron spectroscopy elemental quantification

X-ray photoelectron spectroscopy

Ni1.6Cu1.4(HITP)2 film on carbon cloth · Electrode

XPS atomic percentages and Ni/Cu ratios reported in SI Table S1.

Context: pristine conductive MOF film deposited on carbon cloth
Measurement source: 27 · Supplementary Tables · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
XPS C atomic percentage Ni1.6Cu1.4(HITP)2	88.24	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Cu atomic percentage Ni1.6Cu1.4(HITP)2	1.25	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
Theoretical Ni/Cu feed ratio Ni1.6Cu1.4(HITP)2	1/1	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS N atomic percentage Ni1.6Cu1.4(HITP)2	2.2	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni atomic percentage Ni1.6Cu1.4(HITP)2	1.43	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS O atomic percentage Ni1.6Cu1.4(HITP)2	6.88	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni/Cu ratio Ni1.6Cu1.4(HITP)2	1.6/1.4	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1

X-ray photoelectron spectroscopy elemental quantification

X-ray photoelectron spectroscopy

Ni2.1Cu0.9(HITP)2 film on carbon cloth · Electrode

XPS atomic percentages and Ni/Cu ratios reported in SI Table S1.

Context: pristine conductive MOF film deposited on carbon cloth
Measurement source: 27 · Supplementary Tables · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
XPS C atomic percentage Ni2.1Cu0.9(HITP)2	78.98	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Cu atomic percentage Ni2.1Cu0.9(HITP)2	0.7	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
Theoretical Ni/Cu feed ratio Ni2.1Cu0.9(HITP)2	2/1	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS N atomic percentage Ni2.1Cu0.9(HITP)2	2.76	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni atomic percentage Ni2.1Cu0.9(HITP)2	1.64	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS O atomic percentage Ni2.1Cu0.9(HITP)2	15.92	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni/Cu ratio Ni2.1Cu0.9(HITP)2	2.1/0.9	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1

X-ray photoelectron spectroscopy elemental quantification

X-ray photoelectron spectroscopy

Ni2.3Cu0.7(HITP)2 film on carbon cloth · Electrode

XPS atomic percentages and Ni/Cu ratios reported in SI Table S1.

Context: pristine conductive MOF film deposited on carbon cloth
Measurement source: 27 · Supplementary Tables · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
XPS C atomic percentage Ni2.3Cu0.7(HITP)2	79.78	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Cu atomic percentage Ni2.3Cu0.7(HITP)2	0.65	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
Theoretical Ni/Cu feed ratio Ni2.3Cu0.7(HITP)2	3/1	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS N atomic percentage Ni2.3Cu0.7(HITP)2	2.61	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni atomic percentage Ni2.3Cu0.7(HITP)2	2.14	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS O atomic percentage Ni2.3Cu0.7(HITP)2	14.82	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni/Cu ratio Ni2.3Cu0.7(HITP)2	2.3/0.7	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1

X-ray photoelectron spectroscopy elemental quantification

X-ray photoelectron spectroscopy

Ni3(HITP)2 film on carbon cloth · Electrode

XPS atomic percentages and Ni/Cu ratios reported in SI Table S1.

Context: pristine conductive MOF film deposited on carbon cloth
Measurement source: 27 · Supplementary Tables · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
XPS C atomic percentage Ni3(HITP)2	76.98	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Cu atomic percentage Ni3(HITP)2	-	—	—	SI Table Qualitative	27 · Supplementary Tables · Table S1
Theoretical Ni/Cu feed ratio Ni3(HITP)2	1/0	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS N atomic percentage Ni3(HITP)2	4.04	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni atomic percentage Ni3(HITP)2	1.73	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS O atomic percentage Ni3(HITP)2	17.25	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1
XPS Ni/Cu ratio Ni3(HITP)2	1/0	—	—	SI Table Exact Reported	27 · Supplementary Tables · Table S1