Microscopy Morphology — Electrodeposition of Ni/Cu Bimetallic Conductive Metal–Organic Frameworks Electrocatalysts with Boosted Oxygen Reduction Activity for Zinc–Air Batteries

Measurement evidence

Microscopy Morphology

Electrodeposition of Ni/Cu Bimetallic Conductive Metal–Organic Frameworks Electrocatalysts with Boosted Oxygen Reduction Activity for Zinc–Air Batteries · Liu M., Zhao J., Dong H. et al. · Small · 2024 · 2405309

3 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM/TEM/elemental mapping for monometallic controls

Ni3(HITP)2 film on carbon cloth · Electrode

Supporting SEM/TEM images for Ni3(HITP)2 and Cu3(HITP)2 films.

Geometry
films on carbon cloth
Context
pristine conductive MOF films on substrate
Measurement source
3-4 · 2.1 Material Design and Structural Characterization · Figures S1-S6 cited
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Ni3(HITP)2 nanoflake sizeapproximately 150 nmText
Approximate
3 · 2.1 Material Design and Structural Characterization · Figure S1

SEM/TEM/elemental mapping for monometallic controls

Cu3(HITP)2 film on carbon cloth · Electrode

Supporting SEM/TEM images for Ni3(HITP)2 and Cu3(HITP)2 films.

Geometry
films on carbon cloth
Context
pristine conductive MOF films on substrate
Measurement source
3-4 · 2.1 Material Design and Structural Characterization · Figures S1-S6 cited
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3(HITP)2 small nanosphere sizeapproximately 10 nmText
Approximate
4 · 2.1 Material Design and Structural Characterization · Figure S5

SEM, TEM, HR-TEM, SAED and elemental mapping

Ni2.1Cu0.9(HITP)2 film on carbon cloth · Electrode

Morphology and lattice characterisation of electrodeposited Ni2.1Cu0.9(HITP)2 film.

Geometry
film on carbon cloth; TEM/HAADF-STEM specimens
Context
pristine conductive MOF film on substrate
Measurement source
3-4 · 2.1 Material Design and Structural Characterization · Figure 1c-l
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Element distributionNi, Cu, N and C homogeneously dispersed within nanoflakesText
Qualitative
4 · 2.1 Material Design and Structural Characterization · Figure 1h-l
HR-TEM lattice spacing0.32 nm corresponding to the (002) planeText
Rounded Reported
4 · 2.1 Material Design and Structural Characterization · Figure 1f
Ni2.1Cu0.9(HITP)2 nanoflake sizearound 150 nmText
Approximate
3 · 2.1 Material Design and Structural Characterization · Figure 1d