SEM/TEM/elemental mapping for monometallic controls
Ni3(HITP)2 film on carbon cloth · Electrode
Supporting SEM/TEM images for Ni3(HITP)2 and Cu3(HITP)2 films.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni3(HITP)2 nanoflake size | approximately 150 nm | — | — | Text Approximate | 3 · 2.1 Material Design and Structural Characterization · Figure S1 |