SEM, TEM, HRTEM, HAADF-STEM and elemental mapping
Cu2O@CuHHTP, -1.2 V 30 min · Electrode
TEM at 200 kV; SEM at 10 kV; HAADF-STEM/EDS at 200 kV
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Elemental distribution in Cu2O@CuHHTP | Cu, C and O distributed uniformly | — | — | Text Qualitative | p004 / 23644 · Figure 2d |
| Cu2O(111) lattice fringe in Cu2O@CuHHTP | 0.251 nm | — | — | Text Exact Reported | p004 / 23644 · Figure 2c |
| Cu2O nanoparticle average size after 30 minMarked as a best value within this paper | ca. 3.5 nm | — | — | Text Approximate | p004 / 23644 · Figure 2b; Figure S8 |