thin-film X-ray diffraction and SEM cross-section/top-view microscopy
Zn-NDI@FTO thin film · Thin Film
Thin-film XRD in theta-theta mode, 3-26 degrees 2theta, Cu Kalpha; SEM with Zeiss 1550 Schottky FE-SEM; ImageJ for thickness
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| structure type / space group | common structure type with monoclinic C2 space group | — | — | Text Qualitative | 4 · Results and Discussion · Figure 2 |
| film thickness from ImageJ cross-section | mean length about 680 nm read from rendered ImageJ table | — | — | Visual Estimate Approximate | 11 · Thin-film characterization · Figure S10 |
| simulated linker/window aperture dimension | 14.8 A | — | — | Text Exact Reported | 4 · Results and Discussion · Figure 1/Figure 2 |