Diffraction Structure — Electrochromism in Isoreticular Metal-Organic Framework Thin Films with Record High Coloration Efficiency

Measurement evidence

Diffraction Structure

Electrochromism in Isoreticular Metal-Organic Framework Thin Films with Record High Coloration Efficiency · Kumar A., Li J., Inge A.K. et al. · ACS Nano · 2023 · 21595-21603

3 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

thin-film X-ray diffraction and SEM cross-section/top-view microscopy

Zn-NDI@FTO thin film · Thin Film

Thin-film XRD in theta-theta mode, 3-26 degrees 2theta, Cu Kalpha; SEM with Zeiss 1550 Schottky FE-SEM; ImageJ for thickness

Atmosphere
ambient/sample chamber not specified
Geometry
FTO-supported thin film
Context
pristine_framework thin film on FTO
Measurement source
3-4 · Results and Discussion · Figure 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
structure type / space groupcommon structure type with monoclinic C2 space groupText
Qualitative
4 · Results and Discussion · Figure 2
film thickness from ImageJ cross-sectionmean length about 680 nm read from rendered ImageJ tableVisual Estimate
Approximate
11 · Thin-film characterization · Figure S10
simulated linker/window aperture dimension14.8 AText
Exact Reported
4 · Results and Discussion · Figure 1/Figure 2

thin-film X-ray diffraction and SEM cross-section/top-view microscopy

Zn-PDI@FTO thin film · Thin Film

Thin-film XRD in theta-theta mode, 3-26 degrees 2theta, Cu Kalpha; SEM with Zeiss 1550 Schottky FE-SEM; ImageJ for thickness

Atmosphere
ambient/sample chamber not specified
Geometry
FTO-supported thin film
Context
pristine_framework thin film on FTO
Measurement source
3-4 · Results and Discussion · Figure 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
thin-film preferred orientationorthogonal channels parallel to conductive FTO surfaceText
Qualitative
4 · Results and Discussion · Figure 2
film thickness from ImageJ cross-sectionmean length about 618 nm read from rendered ImageJ tableVisual Estimate
Approximate
10 · Thin-film characterization · Figure S8
simulated linker/window aperture dimension19.2 AText
Exact Reported
4 · Results and Discussion · Figure 1/Figure 2

thin-film X-ray diffraction and SEM cross-section/top-view microscopy

Zn-PMDI@FTO thin film · Thin Film

Thin-film XRD in theta-theta mode, 3-26 degrees 2theta, Cu Kalpha; SEM with Zeiss 1550 Schottky FE-SEM; ImageJ for thickness

Atmosphere
ambient/sample chamber not specified
Geometry
FTO-supported thin film
Context
pristine_framework thin film on FTO
Measurement source
3-4 · Results and Discussion · Figure 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
film thickness from ImageJ cross-sectionmean length about 646 nm read from rendered ImageJ tableVisual Estimate
Approximate
9 · Thin-film characterization · Figure S6
simulated linker/window aperture dimension14.2 AText
Exact Reported
4 · Results and Discussion · Figure 1/Figure 2