XRD using Bruker-AXS diffractometer
DMF-derived MAPbI3 film on mesoporous TiO2 · Thin Film
DMF-derived film after 100 C heating for 0.5 h in glovebox.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| DMF intermediate conversion after annealing | low-angle MOF peaks disappear and perovskite peaks strengthen after 100 C annealing | — | — | Text Qualitative | 038403-5 · 3.2 · Figure 5(a) |
| MAPbI3 XRD (110) peak | 14.17 degrees 2theta | — | — | Text Exact Reported | 038403-5 · 3.2 · Figure 5(a) |
| MAPbI3 XRD (220) peak | 28.49 degrees 2theta | — | — | Text Exact Reported | 038403-5 · 3.2 · Figure 5(a) |
| MAPbI3 XRD (330) peak | 43.27 degrees 2theta | — | — | Text Exact Reported | 038403-5 · 3.2 · Figure 5(a) |