Microscopy Morphology — Volatolomics in Fritillarias and Their Identification by Orientation Controlled cMOF Thin Film Chemiresistors

2 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-HHTP[001]-20C thin film · Thin Film

SEM and tapping-mode AFM characterisation of the selected Cu-HHTP[001]-20C film.

Geometry: thin film
Context: pristine oriented cMOF film
Measurement source: p002-p003 · Results and Discussion · Figure 2c,e; Figure S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-HHTP[001] surface roughness Ra	15 nm	—	—	Text Rounded Reported	p002-p003 · Results and Discussion · Figure 2e
Cu-HHTP[001] film thickness	70 nm	—	—	Text Rounded Reported	p002 · Results and Discussion · Figure S1

Cu-HHTP[100]-20C thin film · Thin Film

SEM and tapping-mode AFM characterisation of the selected Cu-HHTP[100]-20C film.

Geometry: thin film
Context: pristine oriented cMOF film
Measurement source: p002-p003 · Results and Discussion · Figure 2d,f; Figure S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-HHTP[100] surface roughness Ra	42 nm	—	—	Text Rounded Reported	p002-p003 · Results and Discussion · Figure 2f
Cu-HHTP[100] film thickness	110 nm	—	—	Text Rounded Reported	p002 · Results and Discussion · Figure S1