Diffraction Structure — Volatolomics in Fritillarias and Their Identification by Orientation Controlled cMOF Thin Film Chemiresistors

3 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-HHTP[100]-20C thin film · Thin Film

GI-WAXS comparison of Cu-HHTP[100] and Cu-HHTP[001] films.

Geometry: thin films
Context: pristine oriented Cu3(HHTP)2 films
Measurement source: p004 / SI page with Fig. S2 · Supporting Information · Fig. S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
GI-WAXS patterns recorded for both film orientations	GI-WAXS images reported for Cu-HHTP[100] and Cu-HHTP[001] films	—	—	Caption Qualitative	p004 · Supporting Information · Fig. S2

Cu-HHTP[001]-20C thin film · Thin Film

TEM/SAED characterisation of Cu3(HHTP)2 film crystalline phase and lattice fringes.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HR-TEM lattice fringe spacing	~1.8 nm	—	—	Text Approximate	p003 · Results and Discussion · Figure 2i

Cu-HHTP[001]-20C thin film · Thin Film

XRD patterns collected for Cu-HHTP[100] and Cu-HHTP[001] films.

Geometry: thin films
Context: pristine oriented Cu3(HHTP)2 films
Measurement source: p005 / SI page with Fig. S3 · Supporting Information · Fig. S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Out-of-plane and in-plane XRD patterns recorded for both orientations	out-of-plane and in-plane XRD patterns of Cu-HHTP[100] and Cu-HHTP[001] films	—	—	Caption Qualitative	p005 · Supporting Information · Fig. S3