cMOF Evidence Base
Diffraction Structure — Solid-solid interface growth of conductive metal-organic framework nanowire arrays and their supercapacitor application

Measurement evidence

Diffraction Structure

Solid-solid interface growth of conductive metal-organic framework nanowire arrays and their supercapacitor application · Du X., Zhang J., Wang H. et al. · Materials Chemistry Frontiers · 2020 · 243-251

3 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Control-atmosphere SEM and PXRD

X-ray diffraction and scatteringScanning electron microscopy

Cu3(HHTP)2 nanowire arrays in situ grown on Cu foil · Electrode

Products from Ar, Ar/D-H2O, Ar/O2 and Ar/O-H2O atmospheres compared by SEM and PXRD.

Atmosphere
Ar; Ar/degassed water; Ar/O2; Ar/O-H2O
Context
Pristine framework formation under varied atmospheres
Measurement source
main p.4-5, article pp.246-247 · Growth mechanism analysis · Fig. 4; Fig. S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Ar/degassed-water controlClean polished Cu foil after washing; no phases detected in 3 < 2theta < 30 degrees——Text
Qualitative		main p.4, article p.246 · Growth mechanism analysis · Fig. 4d; Fig. S4a
Ar atmosphere controlOnly HHTP deposits under Ar; after ethanol washing no product remains and no phase is detected——Text
Qualitative		main p.4, article p.246 · Growth mechanism analysis · Fig. 4b-c; Fig. S4a
Ar/O2 controlNanowires grow and contain C, O and Cu, but PXRD shows weak broad peak around 28 degrees indicating poor crystallinity—aroundText
Approximate		main p.4, article p.246 · Growth mechanism analysis · Fig. 4e; Fig. S4
Ar/O-H2O optimised conditionMarked as a best value within this paperLarge number of oriented nanowires grow uniformly and densely, exhibiting high crystallinity——Text
Qualitative		main p.5, article p.247 · Growth mechanism analysis · Fig. 4f; Fig. S4a

PXRD

X-ray diffraction and scattering

Cu3(HHTP)2 nanowire arrays in situ grown on Cu foil · Electrode

PANalytical Empyrean diffractometer with Cu radiation, 3 < 2theta < 30 degrees, step size 0.026 degrees, room temperature.

Context
Pristine Cu3(HHTP)2 NWA framework on Cu foil
Measurement source
main p.3-4, article pp.245-246 · Morphology and structural characterization · Fig. 3a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignmentExperimental Cu3(HHTP)2 NWA pattern matches simulated Cu3(HHTP)2 pattern——Qualitative
Qualitative		main p.4, article p.246 · Morphology and structural characterization · Fig. 3a

PXRD

X-ray diffraction and scattering

Fe3(HHB)2 grown on Fe foil · Thin Film

Experimental and simulated PXRD patterns compared for Fe3(HHB)2.

Context
Pristine Fe3(HHB)2 grown on Fe foil
Measurement source
SI p.S15 · Figure S13 caption · Fig. S13
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Fe3(HHB)2 PXRD assignmentExperimental PXRD pattern compared with simulated Fe3(HHB)2 pattern——Caption
Qualitative		SI p.S15 · Figure S13 caption · Fig. S13