cMOF Evidence Base
Spectroscopy — Solid-solid interface growth of conductive metal-organic framework nanowire arrays and their supercapacitor application

Measurement evidence

Spectroscopy

Solid-solid interface growth of conductive metal-organic framework nanowire arrays and their supercapacitor application · Du X., Zhang J., Wang H. et al. · Materials Chemistry Frontiers · 2020 · 243-251

1 measurement group · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

XPS and EPR

X-ray photoelectron spectroscopyElectron paramagnetic resonance

Cu3(HHTP)2 nanowire arrays in situ grown on Cu foil · Electrode

XPS on ThermoFisher Scientific K-Alpha; EPR on Bruker EM/Xplus at room temperature, 9.67 GHz microwave frequency and 20 mW microwave power.

Temperature
room temperature
Context
Pristine Cu3(HHTP)2 NWA framework
Measurement source
main p.5, article p.247 · Growth mechanism analysis · Fig. S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
EPR g factorg = 2.105——Text
Exact Reported		main p.5, article p.247 · Growth mechanism analysis · Fig. S5c
Cu 2p1/2 XPS component954.5 eV——Text
Exact Reported		main p.5, article p.247 · Growth mechanism analysis · Fig. S5b
Cu 2p3/2 XPS component935.1 eV——Text
Exact Reported		main p.5, article p.247 · Growth mechanism analysis · Fig. S5b