cMOF Evidence Base
Microscopy Morphology — Solid-solid interface growth of conductive metal-organic framework nanowire arrays and their supercapacitor application

Measurement evidence

Microscopy Morphology

Solid-solid interface growth of conductive metal-organic framework nanowire arrays and their supercapacitor application · Du X., Zhang J., Wang H. et al. · Materials Chemistry Frontiers · 2020 · 243-251

2 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM

Scanning electron microscopy

Cu3(HHTP)2 nanowire arrays in situ grown on Cu foil · Electrode

Hitachi S-4800 field emission SEM at 10 keV; products examined without Au/Pt coating.

Context
Pristine Cu3(HHTP)2 NWA framework on Cu foil
Measurement source
main p.3-4, article pp.245-246 · Morphology and structural characterization · Fig. 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Mass loading range0.40 to 2.0 mg cm-2——Text
Range		main p.2, article p.244 · Synthesis of Cu3(HHTP)2 NWAs on Cu foils
Mass of Cu3(HHTP)2 NWAs grown on Cu foilfrom ~0.45 to ~2.26 mg——Text
Range		main p.2, article p.244 · Synthesis of Cu3(HHTP)2 NWAs on Cu foils
Nanowire diameterabout 200 nm——Text
Approximate		main p.3, article p.245 · Morphology and structural characterization · Fig. 2
Nanowire lengthabout 2 um——Text
Approximate		main p.3, article p.245 · Morphology and structural characterization · Fig. 2

TEM, SAED and TEM-EDS

Transmission electron microscopyElemental microanalysis and mapping

Cu3(HHTP)2 nanowire arrays in situ grown on Cu foil · Electrode

JEOL JEM2100 TEM at 200 kV; scraped NWA products dispersed in acetone and transferred onto carbon-coated Cu grid.

Context
Pristine Cu3(HHTP)2 nanowires scraped from Cu foil
Measurement source
main p.4, article p.246 · Morphology and structural characterization · Fig. 3b-c; Fig. S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
TEM beam sensitivityNanowires are very sensitive to beam irradiation; lattice fringes rapidly disappear within a few seconds——Text
Qualitative		main p.4, article p.246 · Morphology and structural characterization · Fig. S3
SAED single-crystal featureBright independent diffraction points; {100} and {300} facets——Text
Qualitative		main p.4, article p.246 · Morphology and structural characterization · Fig. 3b
Elemental distribution by TEM-EDSHomogeneous C, O and Cu distribution on Cu3(HHTP)2 nanowire——Text
Qualitative		main p.4, article p.246 · Morphology and structural characterization · Fig. 3c