synchrotron X-ray diffraction
as-prepared Ni-MOF powder · Powder
As-prepared Ni-MOF compared with simulated AA-eclipsed stacking model.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| stacking layer distance | about 3.1 Angstrom | — | — | Text Approximate | 2 · 3.1 · Figure 1b,c |
| XRD structure assignment | synchrotron XRD patterns agree with simulated AA-eclipsed stacking model; 2D crystalline structure | — | — | Text Qualitative | 2 · 3.1 · Figure 1c |