cMOF Evidence Base
Diffraction Structure — Catalytic Metal Nanoparticles Embedded in Conductive Metal–Organic Frameworks for Chemiresistors: Highly Active and Conductive Porous Materials

Measurement evidence

Diffraction Structure

Catalytic Metal Nanoparticles Embedded in Conductive Metal–Organic Frameworks for Chemiresistors: Highly Active and Conductive Porous Materials · Koo W.-T., Kim S.-J., Jang J.-S. et al. · Advanced Science · 2019 · 1900250

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

X-ray diffraction with Cu K-alpha radiation

X-ray diffraction and scattering

Cu3(HHTP)2, Pd@Cu3(HHTP)2, and Pt@Cu3(HHTP)2 powder comparison set · Powder

Crystal structures and (004) z-axis lattice spacing refined for pristine and Pd/Pt-loaded powders.

Context
Comparison of framework retention and metal nanoparticle phases.
Measurement source
p004 · Results and Discussion · Figure 3a; Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3(HHTP)2 (004) lattice distance3.1518 +/- 0.0092 Angstrom—+/- 0.0092 AngstromSI Table
Exact Reported		p013 · Table S1 · Table S1
Cu3(HHTP)2 (004) peak position28.292 deg——SI Table
Exact Reported		p013 · Table S1 · Table S1
Pd@Cu3(HHTP)2 (004) lattice distance3.1531 +/- 0.1654 Angstrom—+/- 0.1654 AngstromSI Table
Exact Reported		p013 · Table S1 · Table S1
Pt@Cu3(HHTP)2 (004) lattice distance3.1543 +/- 0.2775 Angstrom—+/- 0.2775 AngstromSI Table
Exact Reported		p013 · Table S1 · Table S1