Microscopy Morphology — Catalytic Metal Nanoparticles Embedded in Conductive Metal–Organic Frameworks for Chemiresistors: Highly Active and Conductive Porous Materials

Measurement evidence

Microscopy Morphology

Catalytic Metal Nanoparticles Embedded in Conductive Metal–Organic Frameworks for Chemiresistors: Highly Active and Conductive Porous Materials · Koo W.-T., Kim S.-J., Jang J.-S. et al. · Advanced Science · 2019 · 1900250

1 measurement group · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, TEM, HRTEM, STEM, and EDS elemental mapping

Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping

Cu3(HHTP)2, Pd@Cu3(HHTP)2, and Pt@Cu3(HHTP)2 powder comparison set · Powder

SEM/TEM morphology and nanoparticle dispersion of pristine and Pd/Pt-loaded Cu3(HHTP)2 powders.

Context: Pristine control compared with Pd- and Pt-loaded conductive MOF powders.
Measurement source: p003 · Results and Discussion · Figure 2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(HHTP)2 pore/cavity diameter	2 nm	—	—	Text Rounded Reported	p002 · Results and Discussion · Figure 1
Pristine Cu3(HHTP)2 particle diameter	average diameter of 40 nm	—	—	Text Rounded Reported	p002 · Results and Discussion · Figure 2a
Pd(111) lattice distance	2.245 Angstrom	—	—	Text Exact Reported	p002 · Results and Discussion · Figure 2e
Pd nanoparticle size in Cu3(HHTP)2	about 2 nm	—	—	Text Approximate	p003 · Results and Discussion · Figure 2d
Pt(111) lattice fringe spacing	2.265 Angstrom	—	—	Text Exact Reported	p003 · Results and Discussion · Figure 2h
Pt nanoparticle size in Cu3(HHTP)2	average diameter of 2 nm	—	—	Text Rounded Reported	p003 · Results and Discussion · Figure 2g