X-ray photoelectron spectroscopy (XPS)
Cu-MOF powder/sonicated particles · Powder
XPS survey and high-resolution C 1s, O 1s and Cu 2p spectra of Cu-MOF.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| XPS C 1s C-C component | C 1s peak at 287.72 eV assigned to C-C | — | — | Text Exact Reported | 4 · Material Characterization · Figure 2B |
| XPS C 1s C-O component | C 1s peak at 283.98 eV assigned to C-O | — | — | Text Exact Reported | 4 · Material Characterization · Figure 2B |
| XPS Cu2+ satellite peak | Cu2+ satellite peak at 939.51 eV | — | — | Text Exact Reported | 4 · Material Characterization · Figure 2D |
| XPS Cu 2p1/2 peak | Cu 2p1/2 at 952.58 eV | — | — | Text Exact Reported | 4 · Material Characterization · Figure 2D |
| XPS Cu 2p3/2 peak | Cu 2p3/2 at 932.47 eV | — | — | Text Exact Reported | 4 · Material Characterization · Figure 2D |
| XPS O 1s O-Cu component | O-Cu at 530.42 eV | — | — | Text Exact Reported | 4 · Material Characterization · Figure 2C |
| XPS O 1s O-H component | O-H at 532.48 eV | — | — | Text Exact Reported | 4 · Material Characterization · Figure 2C |