Microscopy Morphology — Nanostructured Conductive Metal Organic Frameworks for Sustainable Low Charge Overpotentials in Li–Air Batteries

Measurement evidence

Microscopy Morphology

Nanostructured Conductive Metal Organic Frameworks for Sustainable Low Charge Overpotentials in Li–Air Batteries · Majidi L., Ahmadiparidari A., Shan N. et al. · Small · 2022 · 2102902

3 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, TEM, HRTEM, EELS of discharged cathode

discharged Cu-THQ/GDE cathode · Electrode

Cu-THQ cathode after 10th discharge at 2 A/g; TEM samples sonicated 15 min in acetonitrile and drop-cast on holey carbon coated copper grids

Geometry
discharged cathode and TEM grid
Context
discharge product on c-MOF cathode
Measurement source
4 · 2.3. Characterization of Discharge Product · Figure 2d-f; Figure S7
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Li2O2 product architectureMarked as a best value within this papernanocrystalline grains embedded in amorphous Li2O2Text
Qualitative
4 · 2.3. Characterization of Discharge Product · Figure 2e
Li2O2 nanocrystalline grain sizeMarked as a best value within this paper2-5 nmrangeText
Range
4 · 2.3. Characterization of Discharge Product · Figure 2e

dynamic light scattering

Cu-THQ nanoflakes · Nanosheet

Cu-THQ NFs dispersed in IPA at 25 C; Malvern Zetasizer Nano ZSP, 633 nm laser

Temperature
298
Context
pristine c-MOF nanoflakes
Measurement source
2 · 2.1. Cu-THQ Nanoflakes Characterization · Figure 1a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
average nanoflake lateral sizeMarked as a best value within this paper145 nmText
Exact Reported
2 · 2.1. Cu-THQ Nanoflakes Characterization · Figure 1a

HRTEM / TEM

Cu-THQ nanoflakes · Nanosheet

JEOL JEM2100 at 200 kV; nanoflake suspension on carbon-coated copper grid

Geometry
TEM grid
Context
pristine c-MOF nanoflakes
Measurement source
2 · 2.1. Cu-THQ Nanoflakes Characterization · Figure 1c-e
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
HRTEM d020 spacingd020 = 1.10 nmText
Exact Reported
2 · 2.1. Cu-THQ Nanoflakes Characterization · Figure 1c-e
HRTEM d110 spacingd110 = 1.13 nmText
Exact Reported
2 · 2.1. Cu-THQ Nanoflakes Characterization · Figure 1c-e
open pore sizesmaller than 1 nm<Text
Approximate
2 · 2.1. Cu-THQ Nanoflakes Characterization · Figure 1c-e