Diffraction Structure — Conductive Metal-Organic Frameworks as Ion-to-Electron Transducers in Potentiometric Sensors

Measurement evidence

Diffraction Structure

Conductive Metal-Organic Frameworks as Ion-to-Electron Transducers in Potentiometric Sensors · Mendecki L., Mirica K.A. · ACS Applied Materials and Interfaces · 2018 · 19248-19257

2 measurement groups · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

powder X-ray diffraction after potentiometric measurements

X-ray diffraction and scattering

M3HHTP2 bulk powder series · Powder

PXRD of Cu3HHTP2, Ni3HHTP2, and Co3HHTP2 MOFs after potentiometric measurements with K+-ISM-II electrodes.

Geometry: post-measurement MOFs
Context: MOFs recovered/assessed after device use
Measurement source: 18 · Powder X-ray Diffraction After Potentiometric Measurements · Figure S17

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Crystallinity after potentiometric measurements	PXRD patterns matched bulk powder; crystallinity retained during and after analytical measurements	—	—	Caption Qualitative	18 · PXRD After Potentiometric Measurements · Figure S17

powder X-ray diffraction

X-ray diffraction and scattering

GCE/M3HHTP2 MOF film series · Electrode

Bruker D8 diffractometer, Cu Kalpha radiation, compared with simulated slipped parallel packing.

Geometry: bulk powders
Context: pristine MOF powders
Measurement source: 4 · Powder X-ray Diffraction · Figure S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PXRD structure assignment	patterns consistent with simulated slipped parallel packing and previous reports	—	—	Caption Qualitative	4 · Powder X-ray Diffraction · Figure S2