Microscopy Morphology — Conductive Metal-Organic Frameworks as Ion-to-Electron Transducers in Potentiometric Sensors

Measurement evidence

Microscopy Morphology

Conductive Metal-Organic Frameworks as Ion-to-Electron Transducers in Potentiometric Sensors · Mendecki L., Mirica K.A. · ACS Applied Materials and Interfaces · 2018 · 19248-19257

2 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

light interferometry

GCE/Ni3HHTP2 MOF thickness series · Electrode

Zygo NewView 7300 light interferometer with 10x lens used to measure z-dimension/film height.

Geometry: drop-cast MOF layer on 3 mm glassy carbon electrode
Context: MOF film composite electrode
Measurement source: 10 · Interferometry of GCE/Ni3HHTP2 MOF Electrodes · Figure S7

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source

SEM and EDX

Scanning electron microscopy Elemental microanalysis and mapping

GCE/M3HHTP2 MOF film series · Electrode

Hitachi TM3000 SEM with Bruker Edax light element Si(Li) detector.

Geometry: bulk powder morphology and elemental analysis
Context: pristine MOF powders
Measurement source: 2 · Materials and Instruments · Figure S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
EDX confirms organic-inorganic hybrid materials	EDX confirmed presence of metals and organic/inorganic hybrid composition	—	—	Caption Qualitative	3 · SEM and EDX · Figure S1
Co3HHTP2 morphology	non-uniform nanoscale morphology	—	—	Text Qualitative	3 · Characterization · Figure S1
Ni3HHTP2 and Cu3HHTP2 morphology	distinct rod-shaped crystallites	—	—	Text Qualitative	3 · Characterization · Figure S1