DRIFTS and ex situ XPS after H2S exposure
2D RD Ni3(HITP)2 interface particles · Powder
DRIFTS after exposure to 0.1% H2S in N2 for 30 min; XPS after 1% H2S in N2 for 2 h.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| DRIFTS C-N stretching shift after H2S exposure, peak 1 | 1036 to 1070 cm-1 | — | — | Text Rounded Reported | 1590 · 3.5 Chemiresistive Detection · Figure 6a,b |
| increase in Ni-N-C to Ni-N=C peak area ratio after gas sensing | 5-fold increase | — | — | Text Rounded Reported | 1591 · 3.5 Chemiresistive Detection · Figure 6d |
| EDX sulfur uptake after 20 ppm H2S, interface-particle electrodeMarked as a best value within this paper | 3.2 +/- 0.49% | — | +/- 0.49% | Text Rounded Reported | 1590 · 3.5 Chemiresistive Detection · Figures S98-S105 |
| EDX sulfur uptake after 20 ppm H2S, Zone 3-particle electrode | 0.45% +/- 0.11% | — | +/- 0.11% | Text Rounded Reported | 1590 · 3.5 Chemiresistive Detection · Figures S98-S105 |
| new XPS S 2p peak assigned to H2S-Ni species | 163.7 eV | — | — | Text Rounded Reported | 1591 · 3.5 Chemiresistive Detection · Figure 6d |