Powder/thin-film XRD
NU-1000_Ni-S · Electrode
PXRD patterns of simulated NU-1000, FTO_NU-1000 and NU-1000_Ni-S.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| NU-1000 crystallinity after Ni-S deposition | FTO_NU-1000 and NU-1000_Ni-S retain NU-1000 crystal structure; no apparent Ni-S peaks | — | — | Caption Qualitative | 3 · Supplementary Figure 4 · Supplementary Figure 4 |