Microscopy Morphology — Millimeter-scale semiconductive metal-organic framework single crystal for X-ray imaging

Measurement evidence

Microscopy Morphology

Millimeter-scale semiconductive metal-organic framework single crystal for X-ray imaging · Cheng L., Liang C., Li B. et al. · Cell Reports Physical Science · 2022 · 101004

2 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM and optical photographs during crystal growth

SCU-15 crystals · Single Crystal

Crystals compared at different heating rates and heating times; Figure 2C and Figure S3.

Context
pristine SCU-15 crystals
Measurement source
main p.3-p.4 · Synthesis and characterizations of SCU-15 large single crystals · Figure 2C; Figure S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Block single-crystal dimensions2.9 x 1.9 x 1.5 mm3Text
Approximate
main p.2 and p.5 · Introduction; Comparison of optoelectronic properties · Figure S10
Large-crystal size at fast heating rateMarked as a best value within this paperup to 3 mm at 9 deg C/min ([AB] = 10 min)Text
Approximate
main p.3 · Synthesis and characterizations of SCU-15 large single crystals · Figure 2C; Figure S3
Small-crystal size at slow heating rateapproximately 50 um at 0.125 deg C/min ([AB] = 8 h)Text
Approximate
main p.3 · Synthesis and characterizations of SCU-15 large single crystals · Figure 2C; Figure S3

Scanning electron microscopy (SEM)

SCU-15 SC device · Single Crystal

FEI Quanta 200FEG SEM with 30 keV electron beam; single-crystal and pelleted samples compared.

Context
SCU-15 single-crystal device versus pelleted SCU-15 device
Measurement source
main p.6 and p.9 · Comparison of optoelectronic properties; Characterization · Figures S14-S15
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Pelleted-device morphologysignificant cracks in the pelleted deviceText
Qualitative
main p.6 · Comparison of optoelectronic properties · Figures S14-S15
Single-crystal surface morphologysmooth surfaceText
Qualitative
main p.6 · Comparison of optoelectronic properties · Figure S14