FE-SEM, TEM, AFM and EDX mapping
Scanning electron microscopyTransmission electron microscopyAtomic force microscopyElemental microanalysis and mapping
Exfoliated Ni3(HITP)2 nanosheets · Nanosheet
FE-SEM on silicon wafer, TEM imaging, AFM topography and EDX elemental mapping of nanosheets.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AFM nanosheet thicknessMarked as a best value within this paper | 4.2 +/- 0.3 nm | — | +/- 0.3 nm | Text Exact Reported | main p.4, article p.342 · Results and discussion · Fig. 2c |
| EDX elemental distribution | Ni, C and N homogeneously distributed | — | — | Text Qualitative | main p.4, article p.342 · Results and discussion · Fig. 2d-f |