Diffraction Structure — Diverse π-π Stacking motifs modulate electrical conductivity in tetrathiafulvalene-based metal-organic frameworks

Measurement evidence

Diffraction Structure

Diverse π-π Stacking motifs modulate electrical conductivity in tetrathiafulvalene-based metal-organic frameworks · Xie L.S., Alexandrov E.V., Skorupskii G. et al. · Chemical Science · 2019 · 8558-8565

6 measurement groups · 30 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction

As-synthesised bulk powder of compound 1 · Powder

Cu Kalpha Bragg-Brentano PXRD on powders; compared with simulated SCXRD patterns and activation states.

Atmosphere
ambient measurement not otherwise specified
Geometry
thin layer on zero-background silicon plate
Context
pristine framework
Measurement source
S4; S20-S22 · Powder X-ray diffraction · Fig. S7
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignment and activation responsePXRD phase-pure; dried sample loses crystallinity; supercritical CO2 activation gives crystalline sampleCaption
Qualitative
S20 · PXRD patterns · Fig. S7

Powder X-ray diffraction

As-synthesised bulk powder of compound 2 · Powder

Cu Kalpha Bragg-Brentano PXRD on powders; compared with simulated SCXRD patterns and activation states.

Atmosphere
ambient measurement not otherwise specified
Geometry
thin layer on zero-background silicon plate
Context
pristine framework
Measurement source
S4; S20-S22 · Powder X-ray diffraction · Fig. S8
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignment and activation responsePXRD phase-pure; vacuum-activated sample remains crystallineCaption
Qualitative
S21 · PXRD patterns · Fig. S8

Powder X-ray diffraction

As-synthesised bulk powder of compound 3 · Powder

Cu Kalpha Bragg-Brentano PXRD on powders; compared with simulated SCXRD patterns and activation states.

Atmosphere
ambient measurement not otherwise specified
Geometry
thin layer on zero-background silicon plate
Context
pristine framework
Measurement source
S4; S20-S22 · Powder X-ray diffraction · Fig. S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase assignment and activation responsePXRD phase-pure; vacuum activation loses crystallinity; supercritical CO2 activation gives crystalline sampleCaption
Qualitative
S22 · PXRD patterns · Fig. S9

Single-crystal X-ray diffraction with SHELXT/SHELXL refinement and SQUEEZE for pore solvent

Solvated single crystal of compound 1 · Single Crystal

Low-temperature 100 K diffraction; Cu Kalpha for 1 and Mo Kalpha for 2 and 3.

Temperature
100
Atmosphere
crystal mounted in Paratone oil
Geometry
Bruker-AXS X8 Kappa Duo diffractometer with Smart APEX II CCD
Context
pristine framework
Measurement source
S4; S9-S11 · Single crystal X-ray diffraction · Tables S1-S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Unit-cell volume94614SI Table
Rounded Reported
S9 · Crystal data and structure refinement · Table S1
Calculated crystallographic density0.939SI Table
Exact Reported
S9 · Crystal data and structure refinement · Table S1
Longest nearest-neighbour (S...S)min distance3.64Calculated From Reported
Rounded Reported
S12 · Selected S...S contact distances · Table S4
Final R1 index [I > 2sigma(I)]0.1142SI Table
Exact Reported
S9 · Crystal data and structure refinement · Table S1
Rectangular ligand ratio (RLR)1.7SI Table
Exact Reported
S16 · Table S10 · Table S10
Selected S...S contact-distance range3.447(6)-3.892(4)SI Table
Range
S12 · Selected S...S contact distances · Table S4
SCXRD empirical formulaC272.5H132.2La8O77S32 [+ solvent]SI Table
Exact Reported
S9 · Crystal data and structure refinement · Table S1
Space groupIbamSI Table
Exact Reported
S9 · Crystal data and structure refinement · Table S1
Underlying net topologyPE&M: 17-nodal new 3,4,6,7-c net; STR: 13-nodal new 3,4,6,7-c netCaption
Qualitative
8562 · Topological analysis · Fig. 4

Single-crystal X-ray diffraction with SHELXT/SHELXL refinement and SQUEEZE for pore solvent

Solvated single crystal of compound 2 · Single Crystal

Low-temperature 100 K diffraction; Cu Kalpha for 1 and Mo Kalpha for 2 and 3.

Temperature
100
Atmosphere
crystal mounted in Paratone oil
Geometry
Bruker-AXS X8 Kappa Duo diffractometer with Smart APEX II CCD
Context
pristine framework
Measurement source
S4; S9-S11 · Single crystal X-ray diffraction · Tables S1-S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Unit-cell volume3729.6SI Table
Rounded Reported
S10 · Crystal data and structure refinement · Table S2
Calculated crystallographic density1.592SI Table
Exact Reported
S10 · Crystal data and structure refinement · Table S2
Longest nearest-neighbour (S...S)min distance4.083Calculated From Reported
Rounded Reported
S13 · Selected S...S contact distances · Table S5
Final R1 index [I > 2sigma(I)]0.0484SI Table
Exact Reported
S10 · Crystal data and structure refinement · Table S2
Rectangular ligand ratio (RLR)2.07SI Table
Exact Reported
S16 · Table S10 · Table S10
Selected S...S contact-distance range3.789(3)-5.208(3)SI Table
Range
S13 · Selected S...S contact distances · Table S5
SCXRD empirical formulaC37H24LaNO9S4 [+ solvent]SI Table
Exact Reported
S10 · Crystal data and structure refinement · Table S2
Space groupP21/cSI Table
Exact Reported
S10 · Crystal data and structure refinement · Table S2
Underlying net topologyPE&M: 6-nodal new 3,7-c net; STR: 4-nodal new 3,5-c netCaption
Qualitative
8562 · Topological analysis · Fig. 4

Single-crystal X-ray diffraction with SHELXT/SHELXL refinement and SQUEEZE for pore solvent

Solvated single crystal of compound 3 · Single Crystal

Low-temperature 100 K diffraction; Cu Kalpha for 1 and Mo Kalpha for 2 and 3.

Temperature
100
Atmosphere
crystal mounted in Paratone oil
Geometry
Bruker-AXS X8 Kappa Duo diffractometer with Smart APEX II CCD
Context
pristine framework
Measurement source
S4; S9-S11 · Single crystal X-ray diffraction · Tables S1-S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Unit-cell volume3274SI Table
Rounded Reported
S11 · Crystal data and structure refinement · Table S3
Calculated crystallographic density1.484SI Table
Exact Reported
S11 · Crystal data and structure refinement · Table S3
Longest nearest-neighbour (S...S)min distance7.072Calculated From Reported
Rounded Reported
S14 · Selected S...S contact distances · Table S6
Final R1 index [I > 2sigma(I)]0.0673SI Table
Exact Reported
S11 · Crystal data and structure refinement · Table S3
Rectangular ligand ratio (RLR)1.86SI Table
Exact Reported
S16 · Table S10 · Table S10
Selected S...S contact-distance range3.809(6)-7.650(8)SI Table
Range
S14 · Selected S...S contact distances · Table S6
SCXRD empirical formulaC57H40La2N2O15S6 [+ solvent]SI Table
Exact Reported
S11 · Crystal data and structure refinement · Table S3
Space groupP-1SI Table
Exact Reported
S11 · Crystal data and structure refinement · Table S3
Underlying net topologyPE&M: 10-nodal new 3,4,7-c net; STR: 2-nodal 3,4-c tfoCaption
Qualitative
8562 · Topological analysis · Fig. 4