Measurement evidence
Precise tuning of interlayer electronic coupling in layered conductive metal-organic frameworks · Lu Y., Zhang Y., Yang C.-Y. et al. · Nature Communications · 2022 · 7240
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Ni3(HATI_C1)2 black powder · Powder
Bruker Optics ALPHA-E with universal Zn-Se ATR, 400-4000 cm-1.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| FT-IR N-H stretching after MOF formation | N-H stretching vibration band from ligand disappears | — | — | Text Qualitative | 2 · Results · Supplementary Fig. 6 |
Ni3(HATI_C3)2 black powder · Powder
Bruker Optics ALPHA-E with universal Zn-Se ATR, 400-4000 cm-1.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| FT-IR N-H stretching after MOF formation | N-H stretching vibration band from ligand disappears | — | — | Text Qualitative | 2 · Results · Supplementary Fig. 6 |
Ni3(HATI_C4)2 black powder · Powder
Bruker Optics ALPHA-E with universal Zn-Se ATR, 400-4000 cm-1.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| FT-IR N-H stretching after MOF formation | N-H stretching vibration band from ligand disappears | — | — | Text Qualitative | 2 · Results · Supplementary Fig. 6 |
Ni3(HATI_C1)2 film on heavily doped n-type Si · Thin Film
He I discharge lamp source 21.22 eV, ultrahigh vacuum; films on heavily doped n-type Si transferred air-free.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| work function | 4.0 eV | — | — | Text Exact Reported | 3 · Results · Fig. 3b |
Ni3(HATI_C3)2 film on heavily doped n-type Si · Thin Film
He I discharge lamp source 21.22 eV, ultrahigh vacuum; films on heavily doped n-type Si transferred air-free.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| work function | 4.0 eV | — | — | Text Exact Reported | 3 · Results · Fig. 3b |
Ni3(HATI_C4)2 film on heavily doped n-type Si · Thin Film
He I discharge lamp source 21.22 eV, ultrahigh vacuum; films on heavily doped n-type Si transferred air-free.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| work function | 4.0 eV | — | — | Text Exact Reported | 3 · Results · Fig. 3b |
Ni3(HATI_C1)2 black powder · Powder
Agilent Cary 5000 UV-VIS-NIR spectrophotometer; optical gap estimated from near-infrared onset.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| optical gap from near-infrared onset | 0.5 eV | — | — | Text Exact Reported | 3 · Results · Fig. 3a |
Ni3(HATI_C3)2 black powder · Powder
Agilent Cary 5000 UV-VIS-NIR spectrophotometer; optical gap estimated from near-infrared onset.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| optical gap from near-infrared onset | 0.56 eV | — | — | Figure Axis Approximate | 3 · Results · Fig. 3a |
Ni3(HATI_C4)2 black powder · Powder
Agilent Cary 5000 UV-VIS-NIR spectrophotometer; optical gap estimated from near-infrared onset.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| optical gap from near-infrared onset | 0.64 eV | — | — | Text Exact Reported | 3 · Results · Fig. 3a |
Ni3(HATI_C1)2 film on heavily doped n-type Si · Thin Film
Kratos AXIS Supra/Ultra, monochromatic Al Kalpha 1486.7 eV, ultrahigh vacuum about 3 x 10^-9 Torr.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni oxidation state by XPS | Ni(II) present; Na+ peaks not observed | — | — | Text Qualitative | 2 · Results · Supplementary Fig. 5 |
Ni3(HATI_C3)2 film on heavily doped n-type Si · Thin Film
Kratos AXIS Supra/Ultra, monochromatic Al Kalpha 1486.7 eV, ultrahigh vacuum about 3 x 10^-9 Torr.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni oxidation state by XPS | Ni(II) present; Na+ peaks not observed | — | — | Text Qualitative | 2 · Results · Supplementary Fig. 5 |
Ni3(HATI_C4)2 film on heavily doped n-type Si · Thin Film
Kratos AXIS Supra/Ultra, monochromatic Al Kalpha 1486.7 eV, ultrahigh vacuum about 3 x 10^-9 Torr.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni oxidation state by XPS | Ni(II) present; Na+ peaks not observed | — | — | Text Qualitative | 2 · Results · Supplementary Fig. 5 |