ATR FT-IR spectroscopy
As-synthesised Cu-DBC powder · Powder
Bruker Alpha spectrometer, 400-4000 cm-1.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|
Measurement evidence
Conjugated Copper–Catecholate Framework Electrodes for Efficient Energy Storage · Liu J., Zhou Y., Xie Z. et al. · Angewandte Chemie - International Edition · 2020 · 1081-1086
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
As-synthesised Cu-DBC powder · Powder
Bruker Alpha spectrometer, 400-4000 cm-1.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|
As-synthesised Cu-DBC powder · Powder
XAFS collected at BSRF 4B9A in transmission mode with argon and N2-filled ionization chambers; Athena/Artemis analysis.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EXAFS Cu...C distance | Cu...C R = 2.65 angstrom; N = 1.3; sigma2 = 3 x 10-3 angstrom2; dE = -3.0 eV | — | R factor 0.013 for fit | SI Table Exact Reported | S10 · Section 9. XAFS Measurement · Table S1 |
| EXAFS Cu-O distance | Cu-O R = 1.96 angstrom; N = 4.8; sigma2 = 8 x 10-3 angstrom2; dE = 8.6 eV | — | R factor 0.013 for fit | SI Table Exact Reported | S10 · Section 9. XAFS Measurement · Table S1 |
As-synthesised Cu-DBC powder · Powder
XPS on Thermo ESCALAB 250XI; EPR at room temperature on Bruker a300; EA with vario EL III; TGA 20-800 C under N2 at 10 C min-1.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Elemental analysis carbon found | Found C = 48.38%; calculated C = 48.23% | — | — | SI Table Exact Reported | S12 · Section 13. Elemental Analysis · Table S4 |
| Elemental analysis hydrogen found | Found H = 2.51%; calculated H = 2.49% | — | — | SI Table Exact Reported | S12 · Section 13. Elemental Analysis · Table S4 |
| EPR g value | g = 2.09 | — | — | Text Exact Reported | 1083 · Results and discussion · Figure S13 |
| Thermal stability limit | thermally stable up to 200 C | 473.15 K | — | Text Rounded Reported | 1083 · Results and discussion · Figure S14 |
| XPS Cu2+ component position | 933.72 eV; FWHM 2.28; area 87.53% | — | — | SI Table Exact Reported | S11 · Section 11. XPS Measurement · Table S2 |
| XPS trace Cu+ component position | 932.18 eV; FWHM 1.12; area 12.47% | — | — | SI Table Exact Reported | S11 · Section 11. XPS Measurement · Table S2 |