Diffraction Structure — Layer-by-layer assembled dual-ligand conductive MOF nano-films with modulated chemiresistive sensitivity and selectivity

Measurement evidence

Diffraction Structure

Layer-by-layer assembled dual-ligand conductive MOF nano-films with modulated chemiresistive sensitivity and selectivity · Wu A.-Q., Wang W.-Q., Zhan H.-B. et al. · Nano Research · 2021 · 438-443

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Framework structural assignment from known Cu3(HHTP)2/Cu3(HITP)2 structures and Fig. 1 schematic

x mol% HITP doped Cu-HHTP-10C nanofilm series · Thin Film

2D hexagonal Cu-ligand layer in ab plane; slipped-parallel AB stacking along c-axis; 1D channels.

Geometry: thin-film framework schematic
Context: doped EC-MOF thin-film series with pristine framework comparators
Measurement source: p002 / article p.439 · Results and discussion · Fig. 1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AB stacking interval along c-axis	3.3 A	—	—	Text Rounded Reported	p002 / article p.439 · Results and discussion