Electrical Transport — Layer-by-layer assembled dual-ligand conductive MOF nano-films with modulated chemiresistive sensitivity and selectivity

Measurement evidence

Electrical Transport

Layer-by-layer assembled dual-ligand conductive MOF nano-films with modulated chemiresistive sensitivity and selectivity · Wu A.-Q., Wang W.-Q., Zhan H.-B. et al. · Nano Research · 2021 · 438-443

3 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

I-V curves after ageing

x mol% HITP doped Cu-HHTP-10C nanofilm series · Thin Film

I-V curves of 0.1, 0.5, 1.0, 5.0 and 10.0 mol% HITP-doped films measured 22 months after fabrication in dry air, 200 sccm.

Temperature
298
Atmosphere
dry air, 200 sccm
Geometry
thin films on Au electrodes
Context
doped EC-MOF thin-film series
Measurement source
p007 / SI p.7 · Figure caption · Fig. S8
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Aged-film I-V behaviourapproximately linear I-V curves from -5 to +5 V after 22 monthsVisual Estimate
Qualitative
p007 / SI p.7 · Figure caption · Fig. S8

Cited two-probe pellet conductivity literature comparison

pristine Cu-HHTP literature pellet comparator · Pellet

Room-temperature two-probe pellet conductivities cited for pristine Cu-HHTP and Cu-HITP.

Temperature
298
Atmosphere
not specified
Geometry
pellet, 2 probes
Context
pristine framework literature controls
Measurement source
p003 / article p.440 · Results and discussion
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Pristine Cu-HHTP conductivity cited~ 0.02 S cm-1 at RTText
Approximate
p003 / article p.440 · Results and discussion
Pristine Cu-HITP conductivity citedMarked as a best value within this paper~ 0.2 S cm-1 at RTText
Approximate
p003 / article p.440 · Results and discussion

Two-probe electrical measurement of thin-film current normalised by thickness as sigma/C0

x mol% HITP doped Cu-HHTP-10C nanofilm series · Thin Film

High-resistance thin-film samples measured by two probes; sigma/C0 plotted versus expected HITP dopants.

Temperature
298
Atmosphere
not specified in main text
Geometry
thin film on interdigital electrodes; C0 is a constant for a given electrode geometry and voltage
Context
doped EC-MOF thin-film series
Measurement source
p002 / SI p.2 · Gas sensor characterisations · Equations S2-S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
sigma/C0 at 0.1 mol% HITPabout 1.5e-9 A nm-1 from Fig. 2(c)Figure Axis
Approximate
p003 / article p.440 · Figure caption · Fig. 2(c)
sigma/C0 at 10.0 mol% HITPabout 2.5e-8 A nm-1 from Fig. 2(c)Figure Axis
Approximate
p003 / article p.440 · Figure caption · Fig. 2(c)
sigma/C0 at 1.0 mol% HITPMarked as a best value within this paperabout 1.6e-7 A nm-1 from Fig. 2(c)Figure Axis
Approximate
p003 / article p.440 · Figure caption · Fig. 2(c)
sigma/C0 increase below 1.0 mol% HITP~2 orders of magnitude increaseText
Approximate
p002 / article p.439 · Results and discussion · Fig. 2(c)