Microscopy Morphology — Layer-by-layer assembled dual-ligand conductive MOF nano-films with modulated chemiresistive sensitivity and selectivity

Measurement evidence

Microscopy Morphology

Layer-by-layer assembled dual-ligand conductive MOF nano-films with modulated chemiresistive sensitivity and selectivity · Wu A.-Q., Wang W.-Q., Zhan H.-B. et al. · Nano Research · 2021 · 438-443

1 measurement group · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

AFM top and edge views; SEM imaging

Scanning electron microscopy Atomic force microscopy

x mol% HITP doped Cu-HHTP-10C nanofilm series · Thin Film

AFM images and thickness/roughness plots for 0.1, 0.5, 1.0, 5.0 and 10.0 mol% HITP doped films; SEM images for the same dopant levels plus 1.0 mol% low magnification.

Geometry: thin films on functionalised substrates
Context: doped EC-MOF thin-film series compared with pristine Cu-HHTP-10C
Measurement source: p002-p003 / article pp.439-440 · Results and discussion · Fig. 2; Figs. S1-S6

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
RMS roughness upper limit	less than 15 nm	—	—	Text Approximate	p002 / article p.439 · Results and discussion · Fig. 2(b)
HITP-doped film thickness range	20-70 nm	—	—	Text Range	p001 / article p.438 · Abstract
HITP-doped film thickness upper limit	less than 80 nm	—	—	Text Approximate	p002 / article p.439 · Results and discussion · Fig. 2(b)
RMS roughness at 10.0 mol% HITP	about 14 nm from Fig. 2(b)	—	—	Figure Axis Approximate	p003 / article p.440 · Figure caption · Fig. 2(b)
SEM morphology trend	pinhole-free, dense and continuous films; 10.0 mol% shows visibly rougher/granular surface	—	—	Qualitative Qualitative	p007 / SI p.7 · Figure caption · Fig. S6
Thickness at 0.1 mol% HITP	~19 nm (SI AFM edge values 20.7, 17.8 and 19.3 nm)	—	range 17.8-20.7 nm visually read	Visual Estimate Approximate	p002 / SI p.2 · Figure · Fig. S1
Thickness at 0.5 mol% HITP	~29 nm (SI AFM edge values 29.8, 27.6 and 29.4 nm)	—	range 27.6-29.8 nm visually read	Visual Estimate Approximate	p003 / SI p.3 · Figure · Fig. S2
Thickness at 10.0 mol% HITP	~67 nm (SI AFM edge values 69.8, 66.8 and 65.0 nm)	—	range 65.0-69.8 nm visually read	Visual Estimate Approximate	p006 / SI p.6 · Figure · Fig. S5
Thickness at 1.0 mol% HITP	~25.5 nm (SI AFM edge values 25.6, 26.0 and 25.0 nm)	—	range 25.0-26.0 nm visually read	Visual Estimate Approximate	p004 / SI p.4 · Figure · Fig. S3
Thickness at 5.0 mol% HITP	~47 nm (SI AFM edge values 47.9, 46.1 and 46.6 nm)	—	range 46.1-47.9 nm visually read	Visual Estimate Approximate	p005 / SI p.5 · Figure · Fig. S4