cMOF Evidence Base
Electrical Transport — Chemical Vapor Deposition of Edge-on Oriented 2D Conductive Metal-Organic Framework Thin Films

Measurement evidence

Electrical Transport

Chemical Vapor Deposition of Edge-on Oriented 2D Conductive Metal-Organic Framework Thin Films · Choe M., Koo J.Y., Park I. et al. · Journal of the American Chemical Society · 2022 · 16726-16731

4 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

I-V curves from two-point probe devices

Electrical conductivity

EBL-patterned Cu3(C6O6)2 four-point-probe thin-film device · Electrode

Ohmic contact check between Cu3(C6O6)2 film and Au electrodes.

Geometry
Two-point probe control devices
Context
pristine thin-film device
Measurement source
SI S35 · Figure S27 caption · Figure S27
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrode contact behaviourOhmic contact confirmed——Caption
Qualitative		SI S35 · Figure S27 caption · Figure S27

Four-point probe conductivity using EBL-fabricated Au electrodes and Keithley 4200 analyser

Electrical conductivity

EBL-patterned Cu3(C6O6)2 four-point-probe thin-film device · Electrode

High vacuum; channel length 500 nm and channel width 5 um in main text; VT measurements only with four-point probe devices.

Temperature
298.73
Atmosphere
high vacuum
Geometry
Four-point probe microdevice; main text channel length 500 nm, channel width 5 um; SI EBL pattern channel width 1 um, traces 50 um x 10 um, pads 200 um x 200 um.
Context
pristine thin-film device
Measurement source
main p004 / article page 16729 · Electrical properties · Figure 4a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Average electrical conductivity of Cu3(C6O6)2 thin-film devices at 298.73 KMarked as a best value within this papersigma = 92.95 +/- 14.1 S/cm—+/- 14.1 S/cmText
Exact Reported		main p004 / article page 16729 · Electrical properties · Figure 4a

Two-point probe conductivity on pelletised scraped powder

Electrical conductivity

Scraped Cu3(C6O6)2 powder pellet · Pellet

Powder obtained by scraping thin film; pellet measured at 273 K.

Temperature
273
Geometry
Pelletised powder; SI reports pellet diameter 2 mm and thickness 0.240 nm.
Context
pristine scraped powder pellet
Measurement source
main p004 / article page 16729 · Electrical properties · Figure S28
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Bulk electrical conductivity of pelletised scraped Cu3(C6O6)2 powder at 273 K1.91 (+/-0.1) x 10-2 S/cm—+/- 0.001 S/cmText
Exact Reported		main p004 / article page 16729 · Electrical properties · Figure S28

Variable-temperature four-point-probe conductivity

Electrical conductivity

EBL-patterned Cu3(C6O6)2 four-point-probe thin-film device · Electrode

Device cooled to about 130 K with He compressor in SI method; main transport analysis covers Arrhenius and 3D variable-range hopping regimes.

Temperature
37-298.73
Atmosphere
high vacuum
Geometry
Four-point probe device
Context
pristine thin-film device
Measurement source
main p004 / article page 16729 · Electrical properties · Figure 4b,c and Figure S29
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Arrhenius activation energy from 145-235 KEa = 2.96 meV for 145-235 K——Text
Exact Reported		main p004 / article page 16729 · Electrical properties · Figure 4b
Arrhenius activation energy from 37-45 KEa = 0.677 meV for 37-45 K——Caption
Exact Reported		SI S37 · Figure S29 caption · Figure S29
Low-temperature variable-range hopping regimeln sigma linearly related to T-1/4 between 75 and 175 K, consistent with 3D VRH——Text
Qualitative		main p004 / article page 16729 · Electrical properties · Figure 4c