Microscopy Morphology — Chemical Vapor Deposition of Edge-on Oriented 2D Conductive Metal-Organic Framework Thin Films

3 measurement groups · 11 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

CVD Cu3(C6O6)2 thin film on SiO2/Si · Thin Film

AFM surface roughness for films of different thicknesses on SiO2/Si.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
RMS roughness Rq for 165.8 nm film	Rq of 12.8 nm	—	—	Caption Exact Reported	SI S14 · Figure S6 caption · Figure S6
RMS roughness Rq for 55.0 nm film	Rq of 9.87 nm	—	—	Caption Exact Reported	SI S14 · Figure S6 caption · Figure S6
RMS roughness Rq for 662.7 nm film	Rq of 18.0 nm	—	—	Caption Exact Reported	SI S14 · Figure S6 caption · Figure S6

CVD Cu3(C6O6)2 thin film on SiO2/Si · Thin Film

Surface SEM and elemental maps on Cu3(C6O6)2 thin film on SiO2/Si.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
SEM-EDX elemental homogeneity	Good homogeneity in SEM images and SEM-EDX maps of Cu, O, and C	—	—	Text Qualitative	main p002 / article page 16727 · Results · Figures S7-S8

CVD Cu3(C6O6)2 thin film on SiO2/Si · Thin Film

Thickness controlled by precursor amount with Cu(acac)2:THQ mass ratio 3:1.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Average film thickness, blue film, Cu(acac)2 1.5 mg / THQ 0.5 mg	55.0 nm	—	SD 0.71 nm	SI Table Exact Reported	SI S13 · Table S1 · Table S1
Average film thickness, green film, Cu(acac)2 15 mg / THQ 5 mg	248.2 nm	—	SD 20.1 nm	SI Table Exact Reported	SI S13 · Table S1 · Table S1
Average film thickness, grey film, Cu(acac)2 45 mg / THQ 15 mg	662.7 nm	—	SD 17.2 nm	SI Table Exact Reported	SI S13 · Table S1 · Table S1
Average film thickness, orange film, Cu(acac)2 30 mg / THQ 10 mg	373.8 nm	—	SD 14.5 nm	SI Table Exact Reported	SI S13 · Table S1 · Table S1
Average film thickness, purple film, Cu(acac)2 6 mg / THQ 2 mg	165.8 nm	—	SD 9.04 nm	SI Table Exact Reported	SI S13 · Table S1 · Table S1
Average film thickness, red film, Cu(acac)2 4.5 mg / THQ 1.5 mg	125.2 nm	—	SD 10.2 nm	SI Table Exact Reported	SI S13 · Table S1 · Table S1
Average film thickness, yellow film, Cu(acac)2 3 mg / THQ 1 mg	85.9 nm	—	SD 3.65 nm	SI Table Exact Reported	SI S13 · Table S1 · Table S1