Metal precursorsBis(2,4-pentanedionato)copper(II) (Cu(acac)2), >97.0%, TCI; fixed Cu(acac)2:THQ mass ratio 3:1; Cu(acac)2 amounts in Table S1 from 1.5 to 45 mg.
Linker precursorsTetrahydroxy-1,4-benzoquinone hydrate (C6H4O6.xH2O, THQ), >96.0%, TCI; THQ varied from 0.5 to 15 mg in Table S1.
SolventsNo reaction solvent; substrate pre-rinsed with deionised water, acetone, and isopropyl alcohol.
AtmosphereEvacuated to 7 mTorr, Ar purge at 100 sccm for 10 min, then Ar flow 18 sccm during reaction.
TemperatureFurnace 230; Cu(acac)2 tube position 170; THQ tube position 180
Time0.667
Substrate orientation300 nm SiO2/Si substrate, 1 cm x 1 cm, placed between two one-end-closed inner test tubes facing each other in a quartz tube.
Work-upAfter reaction, furnace cooled naturally to room temperature by turning off power and opening the lid.
Scalability contextLarge-area, highly reflective films over 1 cm x 1 cm substrates; thickness controlled by precursor amount.
Show 4 structured reagent records
| Role | Reagent | Amount / concentration | Source |
|---|
| Metal Source | bis(2,4-pentanedionato)copper(II) (Cu(acac)2) | 1.5, 3, 4.5, 6, 15, 30, or 45 mg in Table S1 | SI S4 · Synthesis of Cu3(C6O6)2 thin film and powder by a CVD method · Table S1 |
| Linker | tetrahydroxy-1,4-benzoquinone hydrate (THQ) | 0.5, 1, 1.5, 2, 5, 10, or 15 mg in Table S1; SI prose also says THQ varied from 0.5 to 3 mg | SI S4 · Synthesis of Cu3(C6O6)2 thin film and powder by a CVD method · Table S1 |
| Other | Ar carrier gas | 100 sccm purge for 10 min, then 18 sccm reaction flow · 99.999% | SI S4 · Synthesis of Cu3(C6O6)2 thin film and powder by a CVD method · Table S1 |
| Other | SiO2/Si substrate | 1 cm x 1 cm, 300 nm SiO2 | SI S4 · Synthesis of Cu3(C6O6)2 thin film and powder by a CVD method · Table S1 |