Measurement evidence
Chemical Vapor Deposition of Edge-on Oriented 2D Conductive Metal-Organic Framework Thin Films · Choe M., Koo J.Y., Park I. et al. · Journal of the American Chemical Society · 2022 · 16726-16731
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Conventional CVD control film without face-to-face inner tubes · Thin Film
Conventional CVD without face-to-face inner tube system.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Conventional CVD control crystallinity | Amorphous thin film product | — | — | Caption Qualitative | SI S11 · Figure S2 caption · Figure S2 |
CVD Cu3(C6O6)2 thin film on SiO2/Si · Thin Film
GIWAXS patterns integrated and Pawley fitted using slipped-parallel Cu3(C6O6)2 structural model; data converted to Cu K alpha.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| GIWAXS in-plane spot assigned to (001) | qxy = 0.95 A-1 | — | — | Text Rounded Reported | main p003 / article page 16728 · Structural analysis · Figure S17 |
| GIWAXS in-plane spot assigned to (002) | qxy = 1.94 A-1, assigned to 0.32 nm real-space distance | 0.32 nm | — | Text Rounded Reported | main p003 / article page 16728 · Structural analysis · Figure S17 |
| GIWAXS out-of-plane spot assigned to (020) | qz = 0.53 A-1 | — | — | Text Rounded Reported | main p003 / article page 16728 · Structural analysis · Figure S17 |
| GIWAXS out-of-plane spot assigned to (040) | qz = 1.04 A-1 | — | — | Text Rounded Reported | main p003 / article page 16728 · Structural analysis · Figure S17 |
| GIWAXS out-of-plane spot assigned to (060) | qz = 1.56 A-1 | — | — | Text Rounded Reported | main p003 / article page 16728 · Structural analysis · Figure S17 |
| Thin-film orientation | Edge-on orientation of Cu3(C6O6)2 on the substrate | — | — | Text Qualitative | main p003 / article page 16728 · Structural analysis · Figure 2c-e |
| Pawley-refined lattice parameter a | a = 13.209196 A | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
| Pawley-refined lattice angle alpha | alpha = 91.1342 deg | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
| Pawley-refined lattice parameter b | b = 23.373806 A | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
| Pawley-refined lattice angle beta | beta = 89.28639 deg | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
| Pawley-refined lattice parameter c | c = 6.163592 A | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
| Pawley-refined unit-cell volume | Cell volume = 1,903.0 A3 | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
| Pawley-refined lattice angle gamma | gamma = 91.14159 deg | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
| Pawley refinement Rp | Rp = 9.84% | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
| Pawley refinement Rwp | Rwp = 5.06% | — | — | SI Table Exact Reported | SI S27 · Table S4 · Table S4 |
Scraped Cu3(C6O6)2 powder pellet · Pellet
Scraped thin-film product transferred to TEM grid; HRTEM zone-axis and FFT analysis.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HRTEM/FFT interlayer distance | 0.31 nm from diffusive arcs at 3.26 nm-1 | — | — | Text Rounded Reported | main p002 / article page 16727 · Structural analysis · Figure S16d |
| HRTEM lattice fringe distance for (020) plane | ~1.2 +/- 0.1 nm | — | +/- 0.1 nm | Text Approximate | main p003 / article page 16728 · Structural analysis · Figure 2b and Figure S16 |