Microscopy Morphology — Chemiresistive Sensor Arrays from Conductive 2D Metal-Organic Frameworks

Measurement evidence

Microscopy Morphology

Chemiresistive Sensor Arrays from Conductive 2D Metal-Organic Frameworks · Campbell M.G., Liu S.F., Swager T.M. et al. · Journal of the American Chemical Society · 2015 · 13780-13783

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Scanning electron microscopy (SEM)

Scanning electron microscopy

Drop-cast MOF 1-3 chemiresistor array · Electrode

Zeiss Ultra55 SEM with EDS detector, operating voltage 5 keV.

Geometry: MOF films on interdigitated gold electrodes; high-magnification MOF sample images.
Context: pristine MOF films/powders
Measurement source: SI S3 and S8 · Instrumentation · Figure S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
SEM device-image scale bar	20 um	—	—	Caption Exact Reported	SI S8 · Figure S3 · Figure S3
SEM high-magnification MOF scale bar	2 um	—	—	Caption Exact Reported	SI S8 · Figure S3 · Figure S3