Diffraction Structure — Metal-organic framework transistors for dopamine sensing

Measurement evidence

Diffraction Structure

Metal-organic framework transistors for dopamine sensing · Song J., Zheng J., Yang A. et al. · Materials Chemistry Frontiers · 2021 · 3422-3427

1 measurement group · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

grazing incidence X-ray diffraction (GIXRD)

15-cycle Cu3(HHTP)2 film on glass · Thin Film

In-plane and out-of-plane GIXRD profiles; incidence angle 0.4 deg.

Geometry
Cu3(HHTP)2 film on glass
Context
pristine Cu3(HHTP)2 film
Measurement source
p002 / 3423 · Results and discussion · Fig. 2b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
in-plane GIXRD peak for (100)2theta = 4.6 degText
Rounded Reported
p002 / 3423 · Results and discussion · Fig. 2b
in-plane GIXRD peak for (200)2theta = 9.5 degText
Rounded Reported
p002 / 3423 · Results and discussion · Fig. 2b
in-plane GIXRD peak for (210)2theta = 12.6 degText
Rounded Reported
p002 / 3423 · Results and discussion · Fig. 2b
out-of-plane GIXRD peak for (002)2theta = 28.1 degText
Rounded Reported
p002 / 3423 · Results and discussion · Fig. 2b
preferred film orientationpreferential oriented growth along [001]Text
Qualitative
p002 / 3423 · Results and discussion · Fig. 2b